NICT-MTAP
  • Manufacturer: Bruker
  • Cantilever Coating:
  • Tip Geometry: Rotated (Symmetric)
  • Number of Cantilevers: 1个悬臂
    F50KHz K225N/m L350um
AFM探针描述

有手工制作的天然金刚石纳米压痕 tip(针尖)

适用的Sample:
Ceramics,Other Hard Samples,Polymers

适用的AFM机型:
Innova

适用的Work Mode:
Nanoindentation,tapping or non-contact

适用的Application:
Mechanical Property Mapping

Coating 描述
tip coating no tip coating,Hand-crafted natural diamond Nanoindenting tip
Tip 规格
tip geometry Rotated (Symmetric)
tip radius (Nom) 40nm
tip height 50um
Front Angle (FA) 55 ±2°
Back Angle (BA) 35 ±2°
Side Angle (SA) 51 ±2°
Cantilever 规格
cantilever geometry Rectangular
K(Nom) 225N/m
Frequency(Nom) 50KHz
length(Nom) 350um
thickness(Nom) 13um
cantilever material Stainless Steel
top layer back --
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Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 300KHz
Spring Const.
Nom: 42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom: 70KHz
Spring Const.
Nom: 2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
探针对比
探针型号对比
开始对比 最多4个
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