AFM探针描述
适用的Sample:
Data Storage,Other Hard Samples,Other Soft Sample
适用的AFM机型:
DimensionIcon,DimensionXR,Innova,JPK,MultiMode,Non-Bruker
适用的Work Mode:
EFM,Electrical Spectroscopy,KPFM,MFM,PFM
适用的Application:
Electrical
Coating 描述
cantilever Front side coating | Magnetic CoCr |
---|---|
cantilever Back side coating | Reflective Aluminum |
tip coating | Magnetic |
Tip 规格
tip geometry | Conical |
---|---|
tip radius (Nom) | 35nm |
tip height | 5-7um |
Front Angle (FA) | 12±20 |
Back Angle (BA) | 12±2° |
Side Angle (SA) | 12±20° |
Cantilever 规格
cantilever geometry | Rectangular |
---|---|
K(Nom) | 3N/m |
Frequency(Nom) | 75KHz |
length(Nom) | 225um |
thickness(Nom) | 3um |
cantilever material | 0.01 - 0.025 Ωcm Antimony (n) doped Si |
top layer back | 40 ±10 nm of Al |
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Frequency
Nom:
70KHz
Spring Const.
Nom:
2.9N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
Frequency
Nom:
300KHz
Spring Const.
Nom:
42N/m
Geometry
Rectangular
Tip Radius
5nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum